@Article{Supelec450,
author = {Eugenio Fazio and A Passaseo and Massimo Alonzo and A Belardini and C Sibilia and M Larciprete and M Bertolotti},
title = {{Measurement of pure Kerr nonlinearity in GaN thin films at 800 nm by means of eclipsing Z-scan experiments}},
journal = {Journal of Optics A : Pure and Applied Optics},
year = {2007},
volume = {9},
number = {2},
pages = {L3-L4},
month = {feb},
note = {Rapid Communication},
url = {http://dx.doi.org/10.1088/1464-4258/9/2/L01},
doi = {10.1088/1464-4258/9/2/L01},
abstract = {We report the measurement of Kerr nonlinearity of thin films of GaN by using the eclipsing Z-scan technique. The measurement was performed using 100 fs pulses at 800 nm. We measured a pure refractive signal, whose associated nonlinear Kerr coefficient was n2 = (-7.3 ± 0.4) × 10-14 cm2 W-1.}
}